Multi-Tip Scanning Force Microscopy with the Needle Sensor
In order to perform electrical measurements on insulating substrates (e.g. SiO2) a multi tip scanning force microscope (AFM) is required
Scheme of a needle sensor and W tip mounted on top of a needle sensor (SEM image). Due to its ultra small footprint the needle sensor (length 3 mm) provides an upgrade from STM to a STM/AFM combination.
A simultaneous measurement of tunneling current and the force signal is possible using a scheme described here.
Atomic steps on SiO2 imaged with the needle sensor.
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