Atomic Force Microscopy
This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
Offers a full color pedagogic approach to atomic force microscopy
Presents the fundamentals of the technique in detail
Discusses related technical aspects in depth
Title: Atomic Force Microscopy
Author: Bert Voigtländer
Springer 2019, 329 p. 155 illus. in color
ISBN 978-3-030-13653-6 (hardback), ISBN 978-3-030-13654-3 (eBook)
Ludovic Bellon, Physics Today Vol. 73, Issue 5, May 2020, p. 57:
“Whether readers are just starting in the field or running an atomic force microscope daily, Voigtländer’s Atomic Force Microscopy will be an excellent companion. It will usefully complement the user manual or the application notes of any instrument. I wish it had been available when I was beginning my journey in nanoscience instrumentation 15 years ago, and I will certainly use it as a reference book for all the students coming through our laboratory’s door from now on.”
The complete review can be found here.
Errata are posted here.
Supplementary material is posted here.
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